Quantitative reliability analysis of flip-chip packages under thermal-cyclic loading and in consideration of parameter uncertainties

نویسندگان

  • Yao Hsu
  • Chih-Yen Su
  • Wen-Fang Wu
چکیده

Department of Business and Entrepreneurial Management, Kainan University, No. 1, Kainan Road, Luchu, Taoyuan 33857, Taiwan, ROC Department of Mechanical Engineering, National Taiwan University, No. 1, Sec. 4, Roosevelt Road, Taipei 10617, Taiwan, ROC Department of Mechanical Engineering and Graduate Institute of Industrial Engineering, National Taiwan University, No. 1, Sec. 4, Roosevelt Road, Taipei 10617, Taiwan, ROC

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عنوان ژورنال:
  • Microelectronics Reliability

دوره 51  شماره 

صفحات  -

تاریخ انتشار 2011